Defect control in semiconductors - proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ... Yokohama, Japan, September 17-22, 1989

Författare
Koji Sumino International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama)
(Edited by K. Sumino.)
Genre
Konferenser, Ej skönlitteratur, Bibliografi, Konferenspublikation
Språk
Engelska
Förlag År Ort Om boken ISBN
1990 Nederländerna 2 vol. ill.